“Semiconductor lithography inspection requires reliable detection of small pattern defects such as bridge, burr, pinch, and contamination. In this study, we propose a two-stage vision-language ...

AI's ability to analyze data at lightning speed is proving especially useful in vision systems used to detect part defects in real time in plastics manufacturing. Traditional vision systems have ...

Focused AI solutions yield better returns in supply chain than broad, ambitious but unproven AI solutions. SKF has used a focused solution to improve product quality.

Computer vision has been around for decades, but in recent years, this technology has been advancing by leaps and bounds. Computer vision is an application of artificial intelligence (AI) that's able ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...